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Takahiro, Katsumi*; Takeshima, Naoki*; Kawatsura, Kiyoshi*; Nagata, Shinji*; Yamamoto, Shunya; Narumi, Kazumasa; Naramoto, Hiroshi
JAERI-Review 2001-039, TIARA Annual Report 2000, p.188 - 189, 2001/11
no abstracts in English
Naramoto, Hiroshi; Xu, Y.; Narumi, Kazumasa; Zhu, X.; Vacik, J.; Yamamoto, Shunya; Miyashita, Kiyoshi*
JAERI-Review 2001-039, TIARA Annual Report 2000, p.183 - 185, 2001/11
no abstracts in English
thin films on a KBr(001) surfaceNarumi, Kazumasa; Naramoto, Hiroshi
JAERI-Review 2001-039, TIARA Annual Report 2000, p.190 - 192, 2001/11
no abstracts in English
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Hanaya, Hiroaki; Tachibana, Hiroyuki
JAERI-Review 2001-039, TIARA Annual Report 2000, p.120 - 121, 2001/11
Gafchromic film (MD-1260) characterized for MeV/u ion beams was tested for measurement of the lateral distribution profiles in the plastic phantom. Gafchromic film was irradiated to 120 Gy using 450 MeV 
Xe
ions through the 10
thick mesh mask having 6 m line-width and 19 inner latice distance to make artificial dose distribution on the film. Analysis of radiation-induced color change of the film was tried using a microscopic spectrophotpmeter having 1 dia. analyzing light. The film has a potencial to know exact lateral irradiation area with sufficient sharpness and dose distribution by converting absorbance to dose on he basis of dose response characteristics, with spatial resolution of 1.
Oura, Chiharu*; Aspuria, E. T.; Ono, Yutaka; Hase, Yoshihiro; Kobayashi, Yasuhiko; Uchimiya, Hirofumi
JAERI-Review 2001-039, TIARA Annual Report 2000, p.67 - 69, 2001/11
no abstracts in English
